List of Speakers in alphabetic order

STEFANO AGNOLI, Università degli Studi di Padova (IT) – An unitary preliminary vision of the processes underlying surface characterization tools
MAURIZIO BENFATTO, Laboratori Nazionali di Frascati INFN (IT) – Introduction to X-ray Absorption Spectroscopy
MARCO BONECHI, Università degli Studi di Firenze (IT) – Colorimetry and Assessment of Corrosion Resistance
ALOIS BONIFACIO, Università degli Studi di Trieste (IT) – Raman Spectroscopy
MASSIMO BONINI, Università degli Studi di Firenze (IT) – Fluorescence Spectroscopy
EMILIA BRAMANTI, CNR-ICCOM Pisa (IT) – ATR-IR Spectroscopy
ANDREA CERRETA, PARK – Spectroscopic investigations via Atomic Force Microscopy: how to obtain electrical, chemical, and mechanical information at the nanoscale
ALESSANDRO COATI, Synchrotron SOLEIL (FR) -Surface X-ray diffraction theory and application
GRAHAM COOKE, HIDEN (UK) – Development of simultaneous dual polarity SIMS instrumentation and applications
ALESSANDRO DE GIACOMO, Universitá degli Studi di Bari – Laser Induced Breakdown Spectroscopy (LIBS) and Nanoparticle Enhanced LIBS
ULRIKE DIEBOLD, Technische Universität Wien (A) – AFM & STMFundamentals
BERNHARD ELSENER, Universitá degli Studi di Cagliari, ETH Zürich – Electrochemical Impadence Spectroscopy: Fundamentals
MARZIA FANTAUZZI, Università degli Studi di Cagliari (IT) – XPS fundamentals
ROBERTO FELICI, CNR – ISM Roma Tor Vergata (IT) – Interactions of X-rays with Matter
ROBERTO FELICI, CNR – ISM Roma Tor Vergata (IT) – Introduction to synchrotron radiation
MASSIMO FOGAZZI, Assing (IT) – WDXRF instrumentation
ROBERTO FELICI, CNR-SPIN Roma (IT) – An overview of synchrotron radiation facilities
EMILIANO FRATINI, Università degli Studi di Firenze (IT) – Introduction to neutron scattering
EMILIANO FRATINI, Università degli Studi di Firenze (IT) – Neutron Reflectometry and GISANS
DAVIDE GAROLDINI, Carl Zeiss S.p.A. (IT) – Multimodal and Multiscale Microscopy for Advanced Characterization of Materials
GIANLUCA GELONI, European XFEL (DE) – X-Ray Free-Electron Lasers: an introduction to working principles and pulse characteristics
FRANCESCO GIANNICI, Università degli Studi di Palermo (IT) – X-ray Raman Scattering
CINZIA GIANNINI, CNR-IC, Bari (IT) – Coherent X-ray imaging and applications
WALTER GIURLANI, Università degli Studi di Firenze (IT) – Xray Fluorescence
BARBARA GIUSSANI, Università degli Studi dell’Insubria (IT) – Chemometrics and Spectroscopy
LUCA GREGORATTI, Sincrotrone ELETTRA Trieste (IT) – Photoemission spectroscopies/microscopies + NAPXPS
TUNZALA KLEIN, KLA – Surface analysis with optical methods
JAN KNUDSEN, Lund University (SWE) – Time-resolved Near Ambient pressure XPS
CHRISTINE KRANZ, University of Ulm (DE) – Electrochemical Scanning probe microscopies
ALFRED LARSSON, Leiden Univesity (NL) – A multi-modal x-ray approach to study materials under harsh conditions
JÖRG LIBUDA, Karlsruhe Institute of Technology (DE) – Electrochemical Infrared spectroscopy
MARIA JOSE’ LO FARO, Università di Catania (IT) – Scanning Electron Microscopy
MARIA JOSE’ LO FARO, Università di Catania (IT) – Rutherford Backscattering Spectrometry
EDVIN LUNDGREN, Lund University (SE) – Surface Optical Reflectance microscopy
BORIS MIZAIKOFF, University of Ulm (DE) – Fundamentals and applications of waveguide-based IR spectroscopy
GERARDO PALAZZO, Università degli studi di Bari (IT) – Measurement of the surface potential
MADDALENA PEDIO, CNR-IOM Trieste (IT) – X-ray absorption spectroscopy: instrumentation and examples
MADDALENA PEDIO, CNR-IOM Trieste (IT) – Introduction to Photoemission Spectroscopy
ROUND TABLE (several speakers) – How to apply for beamtime
ANTONELLA ROSSI, Università degli Studi di Cagliari (IT) – SIMS (Secondary-ion mass spectrometry)
ANTONELLA ROSSI, Università degli Studi di Cagliari (IT) – Auger Electron Spectroscopy: surface nanoanalysis. Thin films: profiles with non-destructive methods
ANTONELLA ROSSI, Università degli Studi di Cagliari (IT) – Calibration, metrology and quality of spectroscopic data
GIUSEPPE SPOTO, Università di Catania (IT) – SPR (Surface plasmon resonance) Spectroscopy
TOMOYO TAO, SHIMADZU (JPN) – IR and Raman Measurements with Integrated
Microscopy
YAHYA ZAKARIA, Termo Fisher Scientific – Future of Depth Profiling in XPS